Reflection by thin layers. In Fig. 35-42, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) The waves of rays r1and r2 interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35- 2 refers to the indexes of refraction n1, localid="1663139751503" n2and n3, the type of interference, the thin-layer thickness Lin nanometres, and the wavelength λin nanometres of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where Lis missing, give the second least thickness or the third least thickness as indicated.

Short Answer

Expert verified

The thickness of the thin layer is 161nm.

Step by step solution

01

Given Data

  • The refractive index of first medium is n1=1.68.
  • The refractive index of the thin film isn2=1.59
  • The refractive index of the third medium n3=1.50
  • The minimum intensity occurs at wavelength λ=342nm.
02

Interference in thin films

Bright colours reflected from thin oil on water and soap bubbles are a consequence of light interference. Due to the constructive interference of light reflected from the front and back surfaces of the thin film, these bright colours can be seen. For a perpendicular incident beam, the maximum intensity of light from the thin film satisfies the condition:

2L=m+12λn2m=0,1,2,...(Maximabrightfilmintheair)

where λis the wavelength of the light in air, L is its thickness, and n2 is the film’s refractive index.

03

Determining the 2nd least thickness for this arrangement of materials.

Here, in this case, light travels in medium with n1=1.68and incident on the film whose refractive index is n2=1.59And then, the light gets reflected of the third surface n3=1.50while travelling through the film. A minimum intensity is observed at λ=342nmand thickness of the film is to be determined at 2nd order of intensity which m=1in this case. As a result, the condition for destructive interference or minimum intensity is

2L=m+12λ342n2 (Destructive)

The 2nd least thickness is

2L=1+12342nm1.59L=3342nm41.59=161nm

Hence the thickness of the thin layer is 161nm.

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Most popular questions from this chapter

A thin flake of mica (n = 1.58) is used to cover one slit of a double-slit interference arrangement. The central point on the viewing screen is now occupied by what had been the seventh bright side fringe (m = 7). If λ=550nm , what is the thickness of the mica?

In a double-slit arrangement the slits are separated by a distance equal to 100 times the wavelength of the light passing through the slits. (a)What is the angular separation in radians between the central maximum and an adjacent maximum? (b) What is the distance between these maxima on a screen 50 cm from the slits?

Light of wavelengthis used in a Michelson interferometer. Letx be the position of the movable mirror, withx=0when the arms have equal lengthsd2=d1. Write an expression for the intensity of the observed light as a function of , lettinglmbe the maximum intensity.

If you move from one bright fringe in a two-slit interference pattern to the next one farther out,

(a) does the path length difference Lincrease or decrease and

(b) by how much does it change, in wavelengths λ ?

White light is sent downward onto a horizontal thin film that is sandwiched between two materials. The indexes of refraction are 1.80for the top material, 1.70for the thin film, and 1.50for the bottom material. The film thickness is5×10-7m . Of the visible wavelengths (400 to 700nm ) that result in fully constructive interference at an observer above the film, which is the (a) longer and (b) shorter wavelength? The materials and film are then heated so that the film thickness increases. (c) Does the light resulting in fully constructive interference shift toward longer or shorter wavelengths?

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