Transmission through thin layers. In Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r3(the light does not reflect inside material 2) and r4(the light reflects twice inside material 2). The waves of r3and r4interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n1,n2and n3, the type of interference, the thin-layer thickness L in nanometers, and the wavelength in nanometers of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where Lis missing, give the second least thickness or the third least thickness as indicated.

Short Answer

Expert verified

The wavelength with maximum intensity of transmitted light is 528nm.

Step by step solution

01

Given Data:

  • The refractive index of first medium isn1=1.68.
  • The refractive index of the thin film isn2=1.59.
  • The refractive index of the third mediumn3=1.50.
  • The thickness of the layer is L=415nm.
02

Interference of light through thin films:

Light that is incident normally on thin films is reflected from both the front and back surfaces, causing interference of the reflected light. When constructive interference happens, it produces bright reflected light, and when entirely destructive interference occurs, it produces a dark region.

03

Determine the wavelength:

The interference of the transmitted rays is similar to the interference of the reflection of light. Here in this case, as n1>n2and n2>n3 the two transmitted rays are 180out of phase.

Therefore, the condition for constructive interference is,

role="math" localid="1663086917743" 2L=m+12λmaxn2λmax=4Ln22m+1

Calculating the wavelength for first few orders number as follow.

For:m=0

role="math" localid="1663087061171" λ1=4415nm1.5920+1=2639nm

For : m=1

role="math" localid="1663087077254" λ2=4415nm1.5921+1=880nm

For :m=2

role="math" localid="1663087102840" λ3=4415nm1.5922+1=528nm

As 528nmlies in visible range, hence the wavelength with maximum intensity of transmitted light is528nm.

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Most popular questions from this chapter

Monochromatic green light, of wavelength 500 nm, illuminates two parallel narrow slits 7.70 mm apart. Calculate the angular deviation ( θin Fig. 35-10) of the third-order (m=3)bright fringe (a) in radians and (b) in degrees.

A 600nm-thick soap film n=1.40in air is illuminated with white light in a direction perpendicular to the film. For how many different wavelengths in the 300to 700nm range is there (a) fully constructive interference and (b) fully destructive interference in the reflected light?

In Fig, monochromatic light of wavelength diffracts through narrow slit S in an otherwise opaque screen. On the other side, a plane mirror is perpendicular to the screen and a distance h from the slit. A viewing screen A is a distance much greater than h. (Because it sits in a plane through the focal point of the lens, screen A is effectively very distant. The lens plays no other role in the experiment and can otherwise be neglected.) Light travels from the slit directly to A interferes with light from the slit that reflects from the mirror to A. The reflection causes a half-wavelength phase shift. (a) Is the fringe that corresponds to a zero path length difference bright or dark? Find expressions (like Eqs. 35-14 and 35-16) that locate (b) the bright fringes and (c) the dark fringes in the interference pattern. (Hint: Consider the image of S produced by the minor as seen from a point on the viewing screen, and then consider Young’s two-slit interference.)

Transmission through thin layers. In Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r3(the light does not reflect inside material 2) and r4(the light reflects twice inside material 2). The waves of r3andr4interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n1,n2and n3the type of interference, the thin-layer thickness Lin nanometers, and the wavelength λin nanometers of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where Lis missing, give the second least thickness or the third least thickness as indicated.

In Fig. 35-37, two radio frequency point sources S1and S2, separated by distance d=2.0m, are radiating in phase with λ=0.50m. A detector moves in a large circular path around the two sources in a plane containing them. How many maxima does it detect?

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