Transmission through thin layers. In Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r3(the light does not reflect inside material 2) and r4(the light reflects twice inside material 2). The waves of r3and r4interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n1,n2and n3the type of interference, the thin-layer thickness Lin nanometers, and the wavelength λin nanometers of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where L is missing, give the second least thickness or the third least thickness as indicated.

Short Answer

Expert verified

The thickness of the thin layer is 161nm.

Step by step solution

01

Given Data.

  • The refractive index of first medium is n1=1.68.
  • The refractive index of the thin film is n2=1.59.
  • The refractive index of the third medium is n3=1.50.
  • The maximum intensity occurs at λmax=342nm.
02

Interference of light through thin films:

Light that is incident normally on thin films is reflected from both the front and back surfaces, causing interference of the reflected light. When constructive interference happens, it produces bright reflected light, and when entirely destructive interference occurs, it produces a dark region.

03

Define the wavelength:

The interference of the transmitted rays is similar to the interference of the reflection of light. Here in this case, as n1>n2and n2>n3 the two transmitted rays have 180phase angle difference.

Therefore, the condition for constructive interference is,

role="math" localid="1663092034628" 2L=m+12λmaxn2L=2m+1λmax4n2

The 2nd least thickness means order number m=1for which the thickness is,

role="math" localid="1663092058636" L=21+1342nm41.59=161nm

Hence, the thickness of the thin layer is 161nm.

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Most popular questions from this chapter

A camera lens with index of refraction greater than 1.30 is coated with a thin transparent film of index of refraction 1.25 to eliminate by interference the reflection of light at wavelength λ that is incident perpendicularly on the lens. What multiple of λgives the minimum film thickness needed?

Transmission through thin layers. In Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r3(the light does not reflect inside material 2) and r4(the light reflects twice inside material 2). The waves of r3and r4interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n1,n2and n3the type of interference, the thin-layer thickness Lin nanometers, and the wavelength λin nanometers of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where Lis missing, give the second least thickness or the third least thickness as indicated.

A thin film with index of refraction n=1.40 is placed in one arm of a Michelson interferometer, perpendicular to the optical path. If this causes a shift of 7.0 bright fringes of the pattern produced by light of wavelength 589nm, what is the film thickness?

In the double-slit experiment of Fig. 35-10, the electric fields of the waves arriving at point P are given by

E1=(2.00μV/m)sin[1.26×1015t]E2=(2.00μV/m)sin[1.26×1015t+39.6rad]

Where, timetis in seconds. (a) What is the amplitude of the resultant electric field at point P ? (b) What is the ratio of the intensity IPat point P to the intensity Icenat the center of the interference pattern? (c) Describe where point P is in the interference pattern by giving the maximum or minimum on which it lies, or the maximum and minimum between which it lies. In a phasor diagram of the electric fields, (d) at what rate would the phasors rotate around the origin and (e) what is the angle between the phasors?

White light is sent downward onto a horizontal thin film that is sandwiched between two materials. The indexes of refraction are 1.80for the top material, 1.70for the thin film, and 1.50for the bottom material. The film thickness is5×10-7m . Of the visible wavelengths (400 to 700nm ) that result in fully constructive interference at an observer above the film, which is the (a) longer and (b) shorter wavelength? The materials and film are then heated so that the film thickness increases. (c) Does the light resulting in fully constructive interference shift toward longer or shorter wavelengths?

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