57 through 68 64, 65 59 Transmission through thin layers.

In Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r3 (the light does not reflect inside material 2) and r4(the light reflects twice inside material 2). The waves of r3 and r4interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n1,n2andn3, the type.

Of interference, the thin-layer thickness L in nanometres, and the wavelength λ in nanometres of the light as measured in air.

Where λ is missing, give the wavelength that is in the visible range.

Where L is missing, give the second least thickness or the third least thickness as indicated?

Short Answer

Expert verified

The second least thickness is 329 nm.

Step by step solution

01

Introduction

Reflection is the process by which electromagnetic radiation is returned either at the boundary between two media (surface reflection) or at the interior of a medium (volume reflection), whereas transmission is the passage of electromagnetic radiation through a medium.

02

Find the second least thickness

We use condition for destructive interference which gives the maximum reflection or minimum transmission.

n1=1.5,n2=1.34 and n3=1.42

n2<n1and n2<n3

Wavelength of light λ=587

The condition of maximum reflection or destructive interference is

m+12λ=2n2LL=m+12λ2n2

Where m=0,1,2,......

For second least thickness m=1

L=1+12587nm21.34=329nm

Hence, the second least thickness is329nm.

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Most popular questions from this chapter

Monochromatic green light, of wavelength 500 nm, illuminates two parallel narrow slits 7.70 mm apart. Calculate the angular deviation ( θin Fig. 35-10) of the third-order (m=3)bright fringe (a) in radians and (b) in degrees.

Figure 35-40 shows two isotropic point sources of light (S1and S2) that emit in phase at wavelength 400 nm and at the same amplitude. A detection point P is shown on an x-axis that extends through source S1. The phase difference ϕbetween the light arriving at point P from the two sources is to be measured as P is moved along the x axis from x=0 out to x=+.The results out to xs=10×10-7m are given in Fig. 35-41. On the way out to + , what is the greatest value of x at which the light arriving at from S1is exactly out of phase with the light arriving at P from S2?

Transmission through thin layers. In Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r3(the light does not reflect inside material 2) and r4(the light reflects twice inside material 2). The waves of r3and r4interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n1,n2and n3the type of interference, the thin-layer thickness Lin nanometers, and the wavelength λin nanometers of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where Lis missing, give the second least thickness or the third least thickness as indicated.

Transmission through thin layers. In Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r3(the light does not reflect inside material 2) and r4(the light reflects twice inside material 2). The waves of and interfere, r3and r4here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n1,n2and n3, the type of interference, the thin-layer thickness Lin nanometers, and the wavelength in nanometers of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where Lis missing, give the second least thickness or the third least thickness as indicated.

Transmission through thin layers. In Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r3(the light does not reflect inside material 2) and r4(the light reflects twice inside material 2). The waves of r3andr4interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n1,n2and n3the type of interference, the thin-layer thickness Lin nanometers, and the wavelength λin nanometers of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where Lis missing, give the second least thickness or the third least thickness as indicated.

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