Estimate the electrical conductivity, at \(135^{\circ} \mathrm{C}\) of silicon that has been doped with \(10^{24} \mathrm{m}\) of aluminum atoms

Short Answer

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Question: Estimate the electrical conductivity of silicon doped with 10^{24} m^{-3} of aluminum atoms at 135°C. Answer: The estimated electrical conductivity of silicon doped with 10^{24} m^{-3} of aluminum atoms at 135°C is approximately 3.6 × 10^3 S·m^{-1}.

Step by step solution

01

Identify the carrier concentration due to the doped aluminum atoms

The problem provides us with the concentration of aluminum atoms (\(N_{Al}\)) in the silicon: \(10^{24} \mathrm{m}^{-3}\). Since aluminum has one less valence electron than silicon, it acts as an acceptor and creates holes in the silicon lattice. Therefore, the hole concentration (\(p\)) in the doped silicon is equal to the concentration of aluminum atoms: \(p = 10^{24} \mathrm{m}^{-3}\).
02

Determine the type of carrier generated by the aluminum dopant

As we concluded in Step 1, aluminum acts as an acceptor in silicon, creating holes as the charge carriers. Therefore, we are dealing with a p-type semiconductor.
03

Calculate the mobility of carriers in silicon at the given temperature

In this problem, we are given the temperature as \(135^{\circ}\mathrm{C}\). To use this information, we need to convert it into Kelvin: \(T = 135 + 273.15 = 408.15\mathrm{K}\). For p-type silicon, the hole mobility at room temperature (\(300\mathrm{K}\)) can be found in standard references, which is approximately \(\mu_p = 450 \mathrm{cm}^2\mathrm{V}^{-1}\mathrm{s}^{-1}\). However, the mobility of carriers is temperature-dependent, and we can estimate the hole mobility at the given temperature (\(T = 408.15\mathrm{K}\)) using the empirical formula: \(\mu(T) = \mu_{300}\cdot\left(\frac{T}{300}\right)^{-2.4}\), where \(\mu_{300}\) is the mobility at room temperature. Applying the formula, we obtain the hole mobility at the given temperature as: \(\mu_p(408.15) = 450 \cdot\left(\frac{408.15}{300}\right)^{-2.4} \approx 225 \mathrm{cm}^2\mathrm{V}^{-1}\mathrm{s}^{-1}\). We need to convert the mobility to the SI unit, which is \(\mathrm{m}^2\mathrm{V}^{-1}\mathrm{s}^{-1}\): \(\mu_{p}=225\cdot10^{-4}\mathrm{m}^2\mathrm{V}^{-1}\mathrm{s}^{-1}\).
04

Apply the conductivity formula to find the electrical conductivity at the given temperature

The electrical conductivity (\(\sigma\)) of a doped semiconductor can be found using the following formula: \(\sigma = e\cdot p \cdot \mu_p\), where \(e\) is the charge of an electron, \(1.6 \times 10^{-19}\mathrm{C}\). Plugging in the values we found previously, we get: \(\sigma = (1.6 \times 10^{-19}\mathrm{C})\cdot (10^{24}\mathrm{m}^{-3})\cdot (225\cdot10^{-4}\mathrm{m}^2\mathrm{V}^{-1}\mathrm{s}^{-1})\). Simplifying, we get the electrical conductivity: \(\sigma \approx 3.6 \times 10^3 \mathrm{S}\cdot\mathrm{m}^{-1}\). Thus, the estimated electrical conductivity of silicon doped with \(10^{24} \mathrm{m}^{-3}\) of aluminum atoms at \(135^{\circ}\mathrm{C}\) is approximately \(3.6 \times 10^3 \mathrm{S}\cdot\mathrm{m}^{-1}\).

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Key Concepts

These are the key concepts you need to understand to accurately answer the question.

P-Type Semiconductors
Semiconductors play a critical role in modern electronics, and their conductivity can be tailored through a process called doping. The incorporation of specific impurities into the semiconductor material determines its conductivity characteristics. P-type semiconductors, one of the two main types of doped semiconductors, result from introducing acceptor impurities, like aluminum, into the silicon crystal lattice.

P-type semiconductors have an abundance of 'holes,' which are essentially the absence of electrons that act as positive charge carriers. When doped with elements such as aluminum, which has one less valence electron than silicon, each dopant atom can accept an electron from the silicon lattice, thereby creating a hole. These holes can move through the lattice and carry charge, which contributes to the material's electrical conductivity. The more the dopant atoms, the higher the number of available holes, resulting in increased conductivity.
Hole Mobility
Hole mobility is a property that describes how quickly 'holes' can move through a semiconductor when an electric field is applied. It is a key factor in the conductivity of p-type semiconductors, as it affects how easily the holes can flow and, thus, how well the material conducts electricity. Mobility can vary with temperature; as the temperature increases, the mobility tends to decrease due to more frequent collisions of charge carriers with lattice vibrations (phonons).

In the example provided, the mobility of holes in p-type silicon needs to be corrected for the operating temperature, which is higher than room temperature. Using an empirical relationship, the mobility can be calculated for the specific temperature in question. This calculation is vital for predicting the material's behavior under various operating conditions and is a direct factor in determining the overall conductivity of the semiconductor.
Carrier Concentration
Carrier concentration in semiconductors refers to the number of charge carriers available per unit volume to participate in the conduction process. In the case of p-type semiconductors, this would be the hole concentration. The carrier concentration is directly related to the amount of doping; the more dopant atoms introduced into the semiconductor, the higher the carrier concentration.

In the doping process described in the exercise, the introduction of a high concentration of aluminum atoms (\(10^{24} \text{m}^{-3}\)) significantly increases the total number of holes in the silicon lattice. By knowing this concentration and the mobility of these carriers, one can accurately determine the material's electrical conductivity using the formula provided. It is important to note that the electrical conductivity is proportional to the product of the carrier concentration and the mobility of those carriers. The carrier concentration is a vital parameter in designing semiconductor devices with desired electrical characteristics.

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